Solutions EnabLing nano Analysis
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SELA Ltd.
Headquarters
5 Hamada St
Southern High Tech Park
Yokneam Elite
2069204 Israel
+972 4 827 3988
Sela USA Inc.
473 Sapena Ct, Suite 6
Santa Clara
95054 CA
USA
+1 408 606 8189
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SCM is one of the most challenging techniques for characterization of advanced semiconductor devices. It requires an ultra-high quality sample with extremely low damage layers and precise positioning, control of thickness uniformity and stringent parallelism of the side walls.